Scanning Electron Microscope

The Scanning Electron Microscope (SEM) is our workhorse for cross section topography, crystal grain misalignment, or chemical analysis in the micron- to nanometer scale.

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Image 1: The SEM in the NFCF shared facility.
Image 2: Cross section of a CrN coating of our topography challenge.
Image 3: The secondary electron map of worn a diamond coating shows the twins of each grain.