Facility

Ellipsometer

  • Alpha-SE ellipsometer for measurements of thickness and optical property of nanometer-thick films.

Ellipsometer

 

Contact angle tester w/ environmental chamber and tilting capability

  • VCA Optima contact angle tester with temperature/humidity control and tilting capability to investigate the liquid/solid interface.

VCA Optima contact angle tester

 

Dip Coater

  • KSV Dip Coater for precise fabrication of sub-nanometer films.

Dip Coater

 

UV-Ozone Procleaner

  • UV/Ozone ProCleaner for surface modification and treatment.

UV-Ozone Procleaner

 

Thermo Gravimetric Analyzer (TGA)

  • TG/DTA 220 for studying the thermal stability of various materials

Thermo Gravimetric Analyzer (TGA)

 

Tribometer

  • CSM Instruments Nano Tribometer 2 (NTR2) for the tribology characterization of various materials. This advanced tribometer allows for detection of low and high frictional forces with superior precision and accuracy.

CSM Instruments Nano Tribometer 2

 

Optical Microscope

  • Carl Zeiss AxioScope

Carl Zeiss AxioScope