Facility
Ellipsometer
- Alpha-SE ellipsometer for measurements of thickness and optical property of nanometer-thick films.
Contact angle tester w/ environmental chamber and tilting capability
- VCA Optima contact angle tester with temperature/humidity control and tilting capability to investigate the liquid/solid interface.
Dip Coater
- KSV Dip Coater for precise fabrication of sub-nanometer films.
UV-Ozone Procleaner
- UV/Ozone ProCleaner for surface modification and treatment.
Thermo Gravimetric Analyzer (TGA)
- TG/DTA 220 for studying the thermal stability of various materials
Tribometer
- CSM Instruments Nano Tribometer 2 (NTR2) for the tribology characterization of various materials. This advanced tribometer allows for detection of low and high frictional forces with superior precision and accuracy.
Optical Microscope
- Carl Zeiss AxioScope