Contact the academic Director of the MMCL, Professor Jörg Wiezorek (e-mail: Wiezorek@pitt.edu, tel.: 412 624 0122) if you are interested or have question regarding MMCL use and offerings.Â
Â
www.engineering.pitt.edu/MMCL/
MATERIALS MICRO-CHARACTERIZATION LABORATORY (MMCL)
The MMCL is located on the 5th floor of Benedum Engineering Hall and part of the Mechanical Engineering and Materials Science Department. The laboratory provides instrumentation and personnel expertise for the complete microstructural characterization and analysis of materials and locally resolved micro- and nano-mechanical measurements. As part of the MMCL the Fischione Instruments Electron Microscopy Sample Preparation Center of Excellence (Fischione Lab) offers a suite of specialized state-of-the-art instruments for the artifact-free preparation of high-quality samples and for anti-contamination solutions for quantitative and highest resolution electron microscopy experiments. Major characterization equipment resources housed in the MMCL include a versatile X-ray diffractometer (XRD) platform, two scanning electron microscopes (SEM) and two transmission electron microscopes (TEM), a multi-mode scanning probe microscope (SPM), a nano-mechanical testing system, a micro-hardness tester and light-optical microscopes (LOM) for metallographic investigations and measurements.Â
For X-ray diffraction investigations the multipurpose diffractometer platform, Empyrean from PANalytical, offers non-destructive, cutting-edge characterization solutions for solids, fluids, thin films or nanomaterials. The system provides detailed information on elemental and/or phase constitution, crystallographic texture, crystalline quality, lattice strains and/or nanoparticle size distributions and shape, which can be acquired with either Cu-K-alpha or Cr-K-alpha X-ray beams. Computers for on-line and off-line processing and analysis of diffraction data are also available in this laboratory.Â
In the SEM laboratory two separate a SEM platforms are available for studies of surface topography and morphology, elemental composition and crystal orientation analyses. The JEOL JSM 6610-LV with Oxford EDS and EBSD is a tungsten-cathode equipped analytical SEM that accepts large samples (diameter ≤8â€) and can operate in a low-vacuum (Environmental) mode. The FEI Apreo Hi-Vac is equipped with a field-emission gun (FEG) and optimized for high-through-put integrated back-scatter diffraction (EBSD) based orientation imaging microscopy (OIM) and energy-dispersive-spectroscopy (EDS) studies for crystal orientation and phase mapping (Team Pegasus Hikari Super Octane 25, Edax). The FEI Apreo FEGSEM is equipped with an Everhart-Thornley secondary electron (SE) detector, two additional in-lens SE detectors for separation of high and low energy SE signals and a segmented back-scatter electron (BSE) detector offering atomic number sensitive contrast formation. This state-of-the-art analytical high-resolution FEGSEM is capable of imaging with 1nm (1.3nm) at 15kV (1kV) without beam deceleration and 1nm at 1kV with beam deceleration. The two SEM instruments permit elemental mapping by energy-dispersive X-ray spectroscopy (EDS) for elements of heavier than Boron (Z>6).Â
The TEM Laboratory offers access to a high-resolution analytical  transmission electron microscopes operating optimally at 200kV. The FEI Tecnai G2 F20 S-Twin TMP microscope is a true multi-purpose computer controlled analytical high-resolution FEG TEM. It offers an information limit of 0.11nm and a lateral spatial resolution at Scherzer defocus of 0.24nm for high resolution atomic lattice imaging (HREM) in combination with a specimen tilt range of ≤±35Ëš and capable of forming intense electron probes as small as ≈0.4nm in diameter. The FEI Tecnai G2 F20 S-Twin is equipped with a bottom-mounted 2kx2k CCD camera, and EDS detector for elemental analysis and a precession electron diffraction assisted automated crystal orientation mapping (NanoMegas Topspin / Astar) for 1nm lateral spatial resolution OIM for quantitative studies of texture, crystallite size, strain and phase fractions in the TEM specimens. It is used for routine high-resolution lattice imaging and permits analysis and characterization of the detailed microstructural and micro-chemical changes in materials by diffraction (selected area, convergent beam and nano-beam diffraction) and EDS with 0.4nm diameter probe size electron beams. This facilitates the study of material interfaces, observing microstructural defects, dislocations, precipitates, and quantifying elemental composition and elemental segregation at the nanometer scale. Apart from standard single-tilt and double-tilt low-background analytical specimen holders, numerous specialized sample holders in-situ studies of materials responses to external thermal, mechanical and thermo-mechanical stimuli. Â
In the SPM lab the DI Dimension 3100 SPM has recently been upgraded with new control electronics and software. It permits atomic force microscopy (AFM), scanning tunneling microscopy (STM), and magnetic force microscopy (MFM) investigations in a single platform. This multi-modal surface morphology and property characterization instrument accepts samples up to eight inches in diameter for SPM analyses in air or fluids and automated stepping can be used to scan multiple areas of the sample without operator intervention. The Nano-mechanical test system is a Hysitron TI900 Triboindenter which allows nano-Newton level resolution depth-resolved measurements of hardness and elastic modulus Both normal (hardness) and lateral (friction) force loading configurations are available to provide a sub-micron scale testing arena with real-time data collection and nanometer resolution in-situ SPM imaging.Â
The Fischione Lab, a private-public partnership between Fischione Instruments and the Department of Mechanical Engineering and Materials Science of the University of Pittsburgh offers access to world-class expertise and a complete suite of state-of-the-art equipment used for high-fidelity and effective electron microscopy sample preparation. Specific instrumentation includes the Fischione Model 1010 Ion-Mill, Model 1040 NanoMill, Model 1050 TEM Mill, Model 1060 SEM Mill, Model 1070 NanoClean Plasma-Cleaner, Model 200 Dimple Grinder, Model 170 Ultrasonic Disk Cutter, Model 110 Twin-Jet Electroplisher, a Allied HighTech Products TechCut4 low speed saw and Multiprep8 automated precision sample preparation system. After consultation with MMCL staff direct support from Fischione Instruments application scientists and engineers facilitates solution of standard and unique, unconventional electron microscopy sample preparation challenges.Â
Contact the academic Director of the MMCL, Professor Jörg Wiezorek (e-mail: Wiezorek@pitt.edu, tel.: 412 624 0122) if you are interested or have question regarding MMCL use and offerings.
Â
The SEM Laboratory
The SEM laboratory is part of the MMCL. Its two separate a SEM platforms provide capabilities for studies of surface topography and morphology, elemental composition and crystal orientation analyses. The JEOL JSM 6610-LV with Oxford EDS and EBSD is a tungsten-cathode equipped analytical SEM that accepts large samples (diameter ≤8â€) and can operate in a low-vacuum (Environmental) mode. The FEI Apreo Hi-Vac is equipped with a field-emission gun (FEG) and optimized for high-through-put integrated back-scatter diffraction (EBSD) based orientation imaging microscopy (OIM) and energy-dispersive-spectroscopy (EDS) studies for crystal orientation and phase mapping (Team Pegasus Hikari Super Octane 25, Edax). The FEI Apreo FEGSEM is equipped with an Everhart-Thornley secondary electron (SE) detector, two additional in-lens SE detectors for separation of high and low energy SE signals and a segmented back-scatter electron (BSE) detector offering atomic number sensitive contrast formation. This state-of-the-art analytical high-resolution FEGSEM is capable of imaging with 1nm (1.3nm) at 15kV (1kV) without beam deceleration and 1nm at 1kV with beam deceleration. The two SEM instruments permit elemental mapping by energy-dispersive X-ray spectroscopy (EDS) for elements of heavier than Boron (Z>6).
Â
The TEM Laboratory
The TEM laboratory is part of the MMCL. It offers access to a 200kV TEM platform system, the FEI Tecnai G2 F20 S-Twin TMP microscope. This instrument is a true multi-purpose computer controlled analytical high-resolution FEG TEM. It offers an information limit of 0.11nm and a lateral spatial resolution at Scherzer defocus of 0.24nm for high resolution atomic lattice imaging (HREM) in combination with a specimen tilt range of ≤±35˚ and capable of forming intense electron probes as small as ≈0.4nm in diameter. The FEI Tecnai G2 F20 S-Twin is equipped with a bottom-mounted 2kx2k CCD camera, and EDS detector for elemental analysis and a precession electron diffraction assisted automated crystal orientation mapping (NanoMegas Topspin / Astar) for 1nm lateral spatial resolution OIM for quantitative studies of texture, crystallite size, strain and phase fractions in the TEM specimens. It is used for routine high-resolution lattice imaging and permits analysis and characterization of the detailed microstructural and micro-chemical changes in materials by diffraction (selected area, convergent beam and nano-beam diffraction) and EDS with 0.4nm diameter probe size electron beams. This facilitates the study of material interfaces, observing microstructural defects, dislocations, precipitates, and quantifying elemental composition and elemental segregation at the nanometer scale. Apart from standard single-tilt and double-tilt low-background analytical specimen holders, numerous specialized sample holders for specimen stimulation by thermal, mechanical and thermo-mechanical loading are available to support increasing interest and needs for in-situ studies.
Â
The SPM Laboratory
The SPM laboratory is part of the MMCL. Its DI Dimension 3100 SPM has recently been upgraded with new control electronics and software and permits atomic force microscopy (AFM), scanning tunneling microscopy (STM), and magnetic force microscopy (MFM) investigations in a single platform. This multi-modal surface morphology and property characterization instrument accepts samples up to eight inches in diameter for SPM analyses in air or fluids and automated stepping can be used to scan multiple areas of the sample without operator intervention. The Nano-mechanical test system is a Hysitron TI900 Triboindenter which allows nano-Newton level resolution depth-resolved measurements of hardness and elastic modulus Both normal (hardness) and lateral (friction) force loading configurations are available to provide a sub-micron scale testing arena with real-time data collection and nanometer resolution in-situ SPM imaging.
Â
The Fischione Laboratory for EM Sample Preparation
As part of the MMCL, the Fischione Lab, a private-public partnership between Fischione Instruments and the Department of Mechanical Engineering and Materials Science of the University of Pittsburgh offers access to world-class expertise and a complete suite of state-of-the-art equipment used for high-fidelity and effective electron microscopy sample preparation. Specific instrumentation includes the Fischione Model 1010 Ion-Mill, Model 1040 NanoMill, Model 1050 TEM Mill, Model 1060 SEM Mill, Model 1070 NanoClean Plasma-Cleaner, Model 200 Dimple Grinder, Model 170 Ultrasonic Disk Cutter, Model 110 Twin-Jet Electroplisher, a Allied HighTech Products TechCut4 low speed saw and Multiprep8 automated precision sample preparation system. After consultation with MMCL staff direct support from Fischione Instruments application scientists and engineers facilitates solution of standard and unique, unconventional electron microscopy sample preparation challenges.
Â